E型探頭

Type E probe

E型(xing)探(tan)(tan)(tan)頭：也稱交叉磁(ci)(ci)(ci)軛探(tan)(tan)(tan)頭或旋(xuan)轉磁(ci)(ci)(ci)場探(tan)(tan)(tan)頭，可一(yi)(yi)次全方位復(fu)合磁(ci)(ci)(ci)化探(tan)(tan)(tan)傷,行走滾輪(lun)和工作燈可提高(gao)探(tan)(tan)(tan)傷速(su)度(du).極(ji)距:110㎜,提升力:ac≥12㎏,重(zhong)量(liang):3.0㎏.獨(du)立利用(yong)這種探(tan)(tan)(tan)頭制成(cheng)一(yi)(yi)臺設備叫旋(xuan)轉磁(ci)(ci)(ci)場探(tan)(tan)(tan)傷儀，它利用(yong)兩只交叉的(de)磁(ci)(ci)(ci)軛采用(yong)交流電移相(xiang)技(ji)術，使之產(chan)生(sheng)隨(sui)時間(jian)變(bian)化的(de)合成(cheng)旋(xuan)轉磁(ci)(ci)(ci)場，對工件一(yi)(yi)次全方位復(fu)合磁(ci)(ci)(ci)化。探(tan)(tan)(tan)傷速(su)度(du)快、檢測質量(liang)高(gao)。

Type E probe: also known as cross yoke probe or rotating magnetic field probe, can perform omnidirectional composite magnetization flaw detection at one time. Walking roller and working lamp can improve flaw detection speed. Pole distance: 110㎜, lifting force: ac≥12㎏, weight: 3.0㎏. A device called rotating magnetic field flaw detector is independently manufactured by using this probe. It uses two crossed yokes to adopt alternating current phase shifting technology to generate a composite rotating magnetic field that changes with time to perform omnidirectional composite magnetization on workpieces. Fast flaw detection speed and high detection quality.